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X-Ray Photoelectron Spectroscopy (XPS), Ultra High Vacuum (UHV) System, and sample load-lock
Reflection High Energy Electron Diffraction (RHEED), High Resolution Low Energy Electron Diffraction (HRLEED), and Auger Electron Spectroscopy (AES)
Scanning Tunneling Microscope (STM)
Atomic Force Microscope (AFM)
Surface Magneto Optic Kerr Effect (SMOKE)
Ferromagnetic Resonance Spectroscopy (FMR), High Resolution Low Energy Electron Diffraction (HRLEED), and Partially Ionized Beam (PIB) Deposition System
Angularly Resolved Light Scattering
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