
1.
Isaacson, D.
Process and apparatus for distinguishing conductivities by electric current
computed tomography.
2.
Gisser, D.G., J.C. Newell, D. Isaacson and J.C. Goble.
Current patterns for impedance tomography.
3.
Goble, J.C., D.
Isaacson and M. Cheney. Three-dimensional impedance imaging processes.
4.
Isaacson, D. and
M. Cheney. Three-dimensional impedance imaging process.
5.
Isaacson, D.,
J.C. Newell and D.G. Gisser. Current patterns for
electrical impedance tomography.
6.
Cheney, M., D.
Isaacson, E.L. Isaacson and E. Somersalo. Layer
stripping for impedance imaging.
7.
Saulnier, G. J.,
D. G. Gisser, J. C. Newell, R.D. Cook, J.C. Goble and
D. Isaacson. High-speed electric tomography.
8.
D. Isaacson. and M. Cheney. Process for producing optimal current
patterns for electrical impedance tomography U.S. Patent #5,588,429
9.
A. Ross and G.
Saulnier. High Output Impedance Current Source. U. S. Patent #7,116,157,
©Rensselaer Polytechnic Institute, Created by Alexander S. Ross