Deposition of Poly(napthalene) (PNT-N) Thin Films

(Silvestri: since January, 1995)

Work to date includes the setup of the PNT-N reactor deposition system and preliminary runs exploring the deposition parameter space in an attempt to determine the ideal temperature and pressure settings for deposition. Once deposition is completed the films are characterized, using various methods to determine the dielectric constant and other properties of the material.


This page was last updated July 17, 1995.

Responses to: Prof. T.-M. Lu


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