MTLE-6430 Materials Characterization

Description
Principles and applications of current techniques for the chemical, structural, and morphological characterization of engineering materials, with an emphasis on materials used in the microelectronics industry. Techniques studied include various electron and ion spectroscopies, electron microscopies, and diffraction techniques.

Prerequisites
Knowledge of physics at the undergraduate engineering level and elementary crystallography.

Textbook(s)
Ordering Information

Format
Classes: 28 sessions
Homework: 10 problem sets
Exams: 2 in class, 1 final
Term Paper/Presentation: 1

Grading (Tentative - final distribution on syllabus)
Homework: 15%
In-class Exams: 40% (2 midterms - in class)
Final: 30% (take home)
Term Paper/Presentation: 15% (last 2 sessions)

Computing
Email and World Wide Web access required for course communications and printing of course notes.

Access to WebCT, Rensselaer's course management tool, is required. Please refer to this page for instructions on how to set up your computer for WebCT.

Who Should Enroll
This course may be used in your Plan of Study as follows:

Degree Programs
CSCI - elective with advisor pre-approval
CSYS - elective with advisor pre-approval
ELEC - elective with advisor pre-approval
EPOW - elective with advisor pre-approval
ESCI-MM - elective with advisor pre-approval
ESCI-MOT - elective with advisor pre-approval
ESCI-MSE - elective with advisor pre-approval
ITEC - n/a
MANE - elective
MBA - elective with advisor pre-approval
MGMT-MS - elective with advisor pre-approval
MGTE - n/a
TCOM - n/a

This course is also open to non-matriculated students who meet the prerequisites.