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Department of Physics, Applied Physics, and Astronomy
Rensselaer Polytechnic Institute
110 Eighth Street, Troy, New York 12180-3590 USA

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Matthew Pelliccione
Physics

Rensselaer\Matthew Pelliccione

I am currently working with Professor Toh-Ming Lu in the Department of Physics, Applied Physics, and Astronomy

My research deals with the experimental and theoretical study of the nano-scale morphological evolution of thin film growth during deposition and etching processes. More specifically, I am investigating the effects of shadowing and particle re-emission on the evolution of growth fronts of thin film surfaces. These growth effects have been shown to be dominant in many common deposition techniques, including sputter deposition and chemical vapor deposition. To this end, my research involves the analysis of solid-on-solid Monte Carlo simulations, analytical continuum equations, and experimentally deposited surfaces.

My goal is to better understand the physical phenomena that dictate various aspects of thin film surfaces in the nano-scale. Many important physical characteristics of these surfaces, including optical, electrical and magnetic properties, are determined by the morphology of the growth front. These physical properties can be better controlled for potential applications with a greater understanding of the dominant growth effects that take place during deposition.

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