Brief description of course:

Ever since the discovery of scanning tunneling microscopy (STM) by Nobel Laureates Binnig and Rohrer (1986), the impact of STM on fundamental research and applications have grown exponentially in `90s. The spin offs of the STM such as atomic force microscopy, magnetic force microscopy, electric force microscopy, etc. under the name of scanning probe microscopy (SPMs) have dazzled the world with images of unprecedented resolution from a wide range of materials and devices. The course is designed for students interested in broadening their views about modern microscopy and its wide applications. Students are required to read assigned articles, browse web pages, take images from a state of the art atomic force microscope under the guidance of an assistant, analyze the data, and submit a final report. The course is suitable for students in all disciplines in schools of science and engineering.

Syllabus