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Nanoink Probe Tip
Misc.
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General Information
Dip Pen Nanolithography is a patented process of writing nanoscale
patterns of molecular "ink" onto a sample substrate, via a coated SPM
tip. The Nanoink DPNWriter System is a fully integrated hardware
and software system that is optimized for the Dip Pen process.
Applications:
- Microfabrication
- Nanotechnology
- Multi-component Nanofabrication
- Silicon-etch Nanostructures
- Directed assembly of Nanotubes
- Templated Nanoparticle Assembly
- Biotechnology
- Protein Nanoarrays
- Ultra-High Density DNA arrays
- Large-Area Biological Patterning
- Biosensor Prototyping
- Molecular Electronics
Features:
- Customized CAD tool capability
uniquely made for DPN pattern design.
- Design elements are organized into a layered hierarchy,
as with IC-design CAD packages
- Elements and groups of elements can be made into arrays
- Polygon objects are made with an optimized space-filling
tool using the writing of parallel lines
- Connected-line patterns, called "paths," are made by a
unique corner-shared drawing tool
- Elements can be drawn with a snap-to-grid efficiency tool
- Design elements are portrayed with a Tree View display
for efficient pattern design organization
- GDS II file import of CAD
files into the InkCAD® design software.
- Files can be designed with third-party CAD software and
then be imported into InkCAD, as long as files are in the GDS II format
- Files are reconstructed into the layering scheme, with
all CAD design elements converted into pattern elements that can be
printed by DPN pens
- Calibration routine for
inks.
- Provides separate diffusion coefficients between dots or
lines
- Dot and line diffusion coefficients are transferable into
design layers as a storable property
- Novel nanoscale ink
alignment routine.
- Permits alignment of one ink layer relative to the next
using the stage navigation environment, not the design window (using
layer shifts).
- Cleaner approach to layer to layer alignment, and it also
extends to multi-probe array tip-to-tip alignment
- Software that models the
deposition of patterns from arrays of multiple DPN pens
- No other commerical package available that considers
multiple pen sources of ink for nanolithography
- InkCAD has a preview window and a probe array menu, which
can create a multi-pattern design out of a single-pen design, along
with considering unique pen array shapes
- Unique nanoscale alignment routines that will store data
on relative tip-to-tip separations, which is required for
layer-to-layer alignment of different inks
- Control capability for Active
Pen arrays
- Customer driver cards and flex circuitry used to drive
the Active Pen systems
- Thermally actuated arrays of DPN pens
- Custom Active Pen hardware, with each pen addressed to a
design layer
- 3 motor leveling system
for Z-approach of probe into feedback
- Specialized software routine makes automatic,
geometrically compensated, leveling operations for the probe arrays,
avoiding careless probe crashes
- 3-motor leveling and software leveling insures that all
probe arrays touch down at the same time
- Scanning tip SPM design
with closed loop linearization
- Provides capability of allowing small sample sizes, that
rest on an automated stage for controlled x-y navigation
- Critical for proper nanolithography performance and
imaging
- Imaging and DPN patterning
capability with both contact and AC modes
- Automated ink-dipping
routines for multi-pen arrays
- Memory controlled, automated motion between the sample
substrate and the inkwells
- Specialized quasi-feedback routine is developed for
dipping probes into the inkwells
- PC-driven environmental control
of both temperature and humidity
- Environmental chamber controls the process environment
for DPN experimentation
- The environmental chamber houses the entire DPN stage
- Both temperature and humidity are controlled by PID
feedback loops
Equipment Configuration and Technical Data:
- Solid Granite Stage
- Video Microscope
- Motorized Zoom/Focus
- 10X Objective Lens
- DPN Scanner
- 90 micron X-Y piezo scan range
- 8 micron Z piezo scan range
- Light lever sensing system
- Closed-loop X-Y-Z Scanning Sensors
- Three Motor Z-Plane
- Motorized X-Y Sample
Translation, 1" range
- Layered Sample Puck for
samples < 2" tall
- Probe Exchange,
cassette-style assembly
- Control Module for DPN
Hardware
- Environmental Chamber
- Air Table for Vibration
Isolation of DPN Stage
- Control and Analysis
Station
- PC with Pentium IV Processor
- Advanced Video and Graphics System
- Dual LCD Flat Panel
Monitors
- InkCAD® Software
- Lattice® for building periodic spotted arrays
- Nanoword® for building text-based patterns
- Dots and Lines®, array-based pattern generation of
dot and line sub-sets
- InkCal®, auto-calibration of ink diffusion for
controlled pattern feature sizes
- InkFinder®, optical micro-scale and SPM-based
nano-scale alignment of consecutive ink pens
- InkMap® for importing bitmap files into InkCAD
- Instrument Control
- Full stage navigation
- AFM imaging capability
- Contact Mode Topography and LFM
- AC mode (non-contact) and phase imaging
- Real-time linescan profile
- Installed Options
- Bias Control for enabling tip-sample bias
Training & Usage
Please contact the module
lead to
schedule a training session. After attending the training session, you
are
expected to return within one week with your own sample to test in the
presence
of the module lead. You may NOT use the equipment
unsupervised until
you
have successfully passed the test.
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Procedures & Documentation
(Under Construction)
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