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Xi-Cheng Zhang
— J. Erik Jonsson '22 Professor of Science
— Professor, Physics, Applied Physics, and Astronomy
— Professor, Electrical, Computer & System Engineering,
Rensselaer Polytechnic Institute
Education
— B.S., Physics, Peking University,
Beijing, China, 1982
— M.S., Physics, Brown University, 1983
— Ph.D., Physics, Brown University, 1986
Career Highlights:
J. Erick Zhang has received six patents, ten patents pending and
numerous awards including the National Science Foundation's CAREER
award, Research Corporation's Cottrell Award, and China's Outstanding
Scholar Award. He is a Fellow of IEEE, the Optical Society of America,
and was elected a Fellow of the American Physics Society in 2002.
He joined RPI in 1992 and has held teaching positions at Xiamen
University, the Chinese Academy of Science and the Shanghai University
of Science and Technology.
Research Areas:
- Terahertz Optics Sensing
- Terahertz Optics Imaging
Terahertz Optics Sensing
Zhang's work with time-domain THz spectroscopy
systems holds promise for diagnostics of materials such as semiconductors
and biomolecules. THz time-domain spectroscopy uses short pulses
of broadband THz radiation, typically generated using ultrafast
laser pulses. The transmitted THz electric field is measured coherently,
which provides both high sensitivity and time-resolved phase information.
Terahertz Optics Imaging
Zhang's interest in THz wave imaging is a result of the availability
of phase-sensitive spectroscopic images. These images, called "functional
images," are ideal for dry dielectric substances including
paper, plastics, and ceramics. Zhang's research centers on two-dimensional
THz wave imaging through free-space electro-optic detection and
on THz ray, or T-ray, imaging for probing the dielectric properties
of three-dimensional structures.
Select Publications
X.-C. Zhang, "Terahertz Wave Imaging: Horizons and Hurdles,"
Physics in Medicine and Biology, 47, 1 (2002).
B. Ferguson, X.-C. Zhang, "Materials for
Terahertz Science and Technology," Review Article Nature
Materials, 1, 26 (2002).
X.-C. Zhang, Q. Chen, "Terahertz Wave Imaging
and its Applications," in Ultrafast Lasers: Technology and
Applications, New York, NY, Marcel Dekker, Inc., 521-572 (2002).
J. Xu, X.-C. Zhang, "Optical Rectification
in an Area with a Diameter Comparable to or Smaller than the Center
Wavelength of Terahertz Radiation," Optics Letters 27,
1067 (2002).
R. J. Blaikie, D. R. S. Cumming, S. M. Durbin,
E. D. Walsby, S. Wang, T. Yuan, J. Xu, X.-C. Zhang, "Characterization
of T-ray Binary Lenses," Optics Letters, 27, 1312 (2002).
D. Abbott, B. Ferguson, D. Gray, S. Wang, , X.-C.
Zhang, "T-ray Computed Tomography," Optics Letters
27, 1312 (2002).
P. M. Ajayan, Y.-C. Chen, T.- M. Lu, N. R. Raravikar,
L. S. Schadler, G.-C. Wang, X.-C. Zhang, Y.-P. Zhao, "Ultrafast
Optical Switch Properties of Single-wall Carbon Nanotube Polymer
Composites at 1.55 µm," Appl. Phys. Letts. 81, 975
(2002).
B. Ferguson, X.-C. Zhang, "Computed Tomography
Adds Third Dimension to Terahertz Imaging," Laser Focus
World, May issue, 133 (2002).
D. Abbott, S. Mickan, J. Munch, X.-C. Zhang, "Noise
Reduction in Terahertz Thin Film Measurement Using Double Modulated
Differential Technique," Fluctuation and Noise Letters
2, R13-R28 (2002).
Q. Chen, Z. Jiang, X.-C. Zhang, "Two-dimensional
Terahertz Wave Imaging," in Terahertz Sources and Systems,
Kluwer Academic Publisher, 225-239 (2001).
Contact Information:
Xi-Cheng Zhang
Professor, Department of Physics, Applied Physics and Astronomy
Professor, Department of Electrical, Computer and System Engineering
Erik Jonsson Chair Professor of Science
Rensselaer Polytechnic Institute
110 Eighth Street
Troy, N.Y. 12180 USA
(518) 276-3079
E-mail: zhangxc@rpi.edu
http://www.rpi.edu/~zhangx
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