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MTLE-6080

Electron Microscopy of Materials

Introduction to electron optics, electron diffraction contrast mechanisms, specimen preparation, and microanalysis. Theory and operating fundamentals of the SEM, TEM, STEM, and the electron microprobe. Analysis of images from crystalline materials using kinematical and dynamical theories of electron diffraction. Prerequisite: MTLE-2100 or MTLE-6040. Fall term.

3 credit hours
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